François Grandpierron | Electronics | Best Researcher Award

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Dr. François Grandpierron | Electronics | Best Researcher Award

Institut d’Electronique de Microélectronique et de Nanotechnologie | France

Dr. François Grandpierron is a device-oriented microelectronics researcher specializing in the design, fabrication, simulation, and electrical characterization of GaN-based transistors for RF and power applications. He is currently a Postdoctoral Researcher at IEMN in Lille, leading process development and TCAD simulations for wide bandgap-based RF and power devices, collaborating closely with cleanroom teams and materials researchers to translate epitaxial advances into scalable device architectures. He earned his PhD in Microelectronics and Nanofabrication from the Graduate School ENGineering and SYstem Sciences in Lille, focusing on the design and fabrication of robust GaN HEMTs for millimeter-wave applications, and also holds a Master’s degree in Chemistry with a specialization in Polymers and Surfaces and a Bachelor’s degree in Chemistry from the University of Rouen Normandy. François has extensive hands-on experience with cleanroom processes including electron beam lithography, photolithography, vacuum deposition, plasma and wet etching, reactive ion etching, rapid thermal annealing, and advanced morphological and electrical characterization techniques. He has contributed to European and national projects addressing high-frequency GaN electronics for radar and space applications and has published in high-impact journals while presenting at international conferences, highlighting innovations in buffer engineering, low-trapping effects, and high-electron confinement. His research has been cited by 42 documents with five publications and an h-index of 3. Fluent in French and English, he is proficient with software such as SILVACO, ADS, IC-CAP, and Origin, and maintains active collaborations bridging academia and industry. Outside research, he enjoys running, swimming, biking, kayaking, and exploring diverse cultures across Europe, South America, Africa, and Asia, reflecting a dynamic and globally engaged perspective.

Featured Publications

Hammou, L. B., Grandpierron, F., Carneiro, E., Ziouche, K., Okada, E., Medjdoub, F., & Patriarche, G. (2025). Effect of high temperature RF stress on the trapping behavior of carbon doped AlN/GaN/AlGaN HEMTs. In 2025 IEEE International Reliability Physics Symposium (IRPS) (pp. 1–8). Monterey, CA, USA.

Grandpierron, F., Carneiro, E., Ben-Hammou, L., Moon, J.-S., & Medjdoub, F. (2024). Understanding and quantifying the benefit of graded aluminum gallium nitride channel high-electron mobility transistors. Micromachines, 15(11), 1356.

Shanbhag, A., Grandpierron, F., Harrouche, K., & Medjdoub, F. (2023). Physical insights of thin AlGaN back barrier for millimeter-wave high voltage AlN/GaN on SiC HEMTs. Applied Physics Letters, 123(4), 142102.

Harrouche, K., Venkatachalam, S., Ben-Hammou, L., Grandpierron, F., Okada, E., & Medjdoub, F. (2023). Low trapping effects and high electron confinement in short AlN/GaN-on-SiC HEMTs by means of a thin AlGaN back barrier. Micromachines, 14, 291.

Godfred Bonsu| Circuit and Signal Processing | Best Researcher Award

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Mr. Godfred Bonsu | Circuit and Signal Processing | Best Researcher Award

Iowa State University | United States

Godfred Osei Bonsu is a highly motivated and accomplished electrical engineer currently pursuing a Ph.D. in Electrical Engineering at Iowa State University, where he maintains a perfect GPA and focuses on analog and mixed-signal VLSI circuit design, data converters, microwave engineering, and data analytics. His research centers on ultra-small area, low-cost DAC design, analog fault detection, and multisite analog and mixed-signal testing, where he develops innovative methodologies to detect soft faults, improve INL and DNL, and decompose cross-wafer die-specification variations. Godfred has contributed to multiple high-impact publications, including works on redundancy-interpolated DACs, statistical analysis of nonlinearity errors, and high-resolution waveform generation, accepted at prestigious conferences such as the International Test Conference and IEEE International Midwest Symposium on Circuits and Systems. Before his doctoral studies, Godfred earned a B.Sc. in Electrical and Electronic Engineering from Kwame Nkrumah University of Science and Technology, graduating with distinction and receiving the Tullow Oil Scholarship for academic excellence. He has also been recognized on the Provost’s List multiple times and was part of the winning team of the National Science and Maths Quiz. His technical skills include Python, MATLAB, Cadence Virtuoso, and INNOVUS, applied in designing operational amplifiers, bandgap voltage references, current mirrors, and efficient data converter architectures. Godfred combines his research expertise with hands-on teaching experience, having served as a teaching assistant at KNUST for courses including power electronics, electric drives, and synchronous machines. Additionally, he has reached thousands of students worldwide as an online tutor, providing high-quality lessons in linear electronic circuits, power generation, and applied electricity. With a strong foundation in research, teaching, and innovation, Godfred is dedicated to advancing the field of electrical engineering through cutting-edge circuit design, rigorous testing methodologies, and impactful knowledge dissemination.

Profile: Orcid

Featured Publications

  • Bonsu, G., Tamakloe, K., Bruce, I., Nti Darko, E., & Chen, D. (2025). Redundancy-interpolated three-segment DAC with on-chip digital calibration for improved static linearity. Paper accepted at International Test Conference.

  • Nti-Darko, E., Karimpour, S., Bruce, I., Bonsu, G., & Chen, D. (2025). Ultra-pure high-resolution waveform generation using low-cost data converters with dithering. Paper accepted at International Test Conference.

  • Bonsu, G., Bruce, I., Nti-Darko, E., Tamakloe, K., & Chen, D. (2025). Statistical analysis of the nonlinearity errors of unary and binary-weighted DACs. Manuscript submitted to International Test Conference.

  • Bonsu, G., Bruce, I., Nti-Darko, E., Tamakloe, K., & Chen, D. (2025). A three-segment small area interpolating DAC with redundancy-based calibration for high linearity. Paper accepted at IEEE International Midwest Symposium on Circuits and Systems.